Detail publikačního výsledku

Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy

DRUCKMÜLLER, M.; OHLÍDAL, I.

Originální název

Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy

Anglický název

Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force

Druh

Kapitola, resp. kapitoly v odborné knize

Autoři

DRUCKMÜLLER, M.; OHLÍDAL, I.

Vydáno

01.01.1994

Nakladatel

JOHN WILEY AND SONS

Místo

CHICHESTER

ISBN

0471978272

Kniha

ECASIA 97

Strany od

1051

Strany počet

4

BibTex

@inbook{BUT53494,
  author="Miloslav {Druckmüller} and Ivan {Ohlídal}",
  title="Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy",
  booktitle="ECASIA 97",
  year="1994",
  publisher="JOHN WILEY AND SONS",
  address="CHICHESTER",
  pages="4",
  isbn="0471978272"
}