Detail publikace

Charge transport and noise sources in thick conducting films

ŠIKULA, J. KOKTAVÝ, B. PAVELKA, J. SEDLÁKOVÁ, V. ROČAK, D. BELAVIČ, D. TACANO, M.

Originální název

Charge transport and noise sources in thick conducting films

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Thick conducting film resistors were made with different types of resistor pastas with 10 kohm/sq and 1 Mohm/sq. Charge carrier transport was investigated in order to find sources of current noise in these samples. A fundamental 1/f noise and excess 1/f^a noise were found. On the borders of metal-oxide particles burst noise can be detected.

Klíčová slova v angličtině

Noise, thick film, burst noise

Autoři

ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; SEDLÁKOVÁ, V.; ROČAK, D.; BELAVIČ, D.; TACANO, M.

Vydáno

1. 1. 1999

Nakladatel

Electronic Components Institute Internationale Ltd.

Místo

UK

Strany od

163

Strany do

166

Strany počet

4

BibTex

@inproceedings{BUT4100,
  author="Josef {Šikula} and Bohumil {Koktavý} and Jan {Pavelka} and Vlasta {Sedláková} and Dubravka {Ročak} and Darko {Belavič} and Munecazu {Tacano}",
  title="Charge transport and noise sources in thick conducting films",
  booktitle="Proceedings of 13th European Passive Components Symposium CARTS-Europe '99",
  year="1999",
  pages="4",
  publisher="Electronic Components Institute Internationale Ltd.",
  address="UK"
}