Detail publikace

Ion Scattering Spectrosopy - A Tool for Surface Analysis.

PRŮŠA, S., ŠIKOLA, T., VOBORNÝ, S., BÁBOR, P.

Originální název

Ion Scattering Spectrosopy - A Tool for Surface Analysis.

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Ion Scattering Spectroscopy (ISS) is one of the analytical techniques which are developed and used at the institute surface science group for chemical composition analysis of solid state surfaces and thin films. The chemical composition is calculated from the time of flight spectrum of noble gases ions scattered on the examined surfaces. Their energy after scattering is measured by two meters long drift tube ended by a particle detector. Two typical experimental results measured on Cu/SiO2 and Ga/SiO2 samples are discussed.

Klíčová slova v angličtině

ISS, ion scattering, TOF

Autoři

PRŮŠA, S., ŠIKOLA, T., VOBORNÝ, S., BÁBOR, P.

Rok RIV

2001

Vydáno

19. 9. 2001

Nakladatel

Fakulta strojního inženýrství VUT v Brně

Místo

Brno

Strany od

86

Strany do

90

Strany počet

5

BibTex

@inproceedings{BUT3354,
  author="Stanislav {Průša} and Tomáš {Šikola} and Stanislav {Voborný} and Petr {Bábor}",
  title="Ion Scattering Spectrosopy - A Tool for Surface Analysis.",
  booktitle="Juniormat '01 sborník",
  year="2001",
  pages="5",
  publisher="Fakulta strojního inženýrství VUT v Brně",
  address="Brno"
}