Detail publikačního výsledku

Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison

GRILL, R.

Originální název

Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison

Anglický název

Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The comparison of technology, conductivity mechanisms, capacitance and their activation energies is performed for NbO and Ta capacitors. Va caracteristics in normal and reverse mode at room and elevated temperatures have been measured and MIS structure characteristics have been evaluated.

Anglický abstrakt

The comparison of technology, conductivity mechanisms, capacitance and their activation energies is performed for NbO and Ta capacitors. Va caracteristics in normal and reverse mode at room and elevated temperatures have been measured and MIS structure characteristics have been evaluated.

Klíčová slova v angličtině

NbO capacitors, Ta capacitors, MIS structure characteristics, Nb2O5, Ta2O5

Autoři

GRILL, R.

Vydáno

01.01.2005

Nakladatel

IMAPS Benelux

Místo

Bruggy, Belgie

Kniha

15th European Microelectronics and Packaging Conference Proceedings

Strany od

540

Strany počet

6

BibTex

@inproceedings{BUT16509,
  author="Josef {Šikula} and Vlasta {Sedláková} and Jan {Hlávka} and Pavel {Höschel} and Roman {Grill} and Zdeněk {Sita} and Tomáš {Zedníček}",
  title="Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison",
  booktitle="15th European Microelectronics and Packaging Conference Proceedings",
  year="2005",
  pages="6",
  publisher="IMAPS Benelux",
  address="Bruggy, Belgie"
}