Detail publikace

Supercapacitor Degradation and Reliability

KUPAROWITZ, T. SEDLÁKOVÁ, V. ŠIKULA, J. MAJZNER, J. SEDLÁK, P.

Originální název

Supercapacitor Degradation and Reliability

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Degradation of supercapacitor (SC) is analyzed by accelerated aging test. Evolution of SC parameters is determined before the aging test, and during up to 8x10 5 cycles of both 75% and 100% energy cycling. Capacitance fading, equivalent series resistance (ESR) increase, and leakage current trend are analyzed for off-the-shelf CapXX SC. Presented model consists of five parameters. These are Helmholtz and diffuse double layer capacitances, esponsible for SC overall capacity. Next there is time dependent resistance in between Helmholtz and diffuse capacitances. And an ordinary ESR, and resistance responsible for SCs leakage current. Fading of both capacitances is modeled by exponential equation. Increase of ESR AC component is modeled by linear function.

Klíčová slova

Supercapacitor, Aging test, Capacitance fading, Equivalent series resistance fading, Leakage current fading, Life-time

Autoři

KUPAROWITZ, T.; SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P.

Vydáno

12. 9. 2017

ISBN

978-80-905768-8-9

Kniha

Passive Components Networking days EPCI Passive Components Networking Symposium 2017

Strany od

63

Strany do

68

Strany počet

6

BibTex

@inproceedings{BUT141571,
  author="Tomáš {Kuparowitz} and Vlasta {Sedláková} and Josef {Šikula} and Jiří {Majzner} and Petr {Sedlák}",
  title="Supercapacitor Degradation and Reliability",
  booktitle="Passive Components Networking days EPCI Passive Components Networking Symposium 2017",
  year="2017",
  pages="63--68",
  isbn="978-80-905768-8-9"
}