Detail publikace

Virtual screening, ADMET profiling, molecular docking and dynamics approaches to search for potent selective natural molecule based inhibitors against metallothionein-III to study Alzheimer's disease

ROY, S. KUMAR, A. PROVAZNÍK, I.

Originální název

Virtual screening, ADMET profiling, molecular docking and dynamics approaches to search for potent selective natural molecule based inhibitors against metallothionein-III to study Alzheimer's disease

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Metallothionein-III (MT-III) displays neuro-inhibitory activity and is involved in the repair of neuronal damage. An altered expression level of MT-III suggests that it could be a mitigating factor in Alzheimer's disease (AD) neuronal dysfunction. Currently there are limited marketed drugs available against MT-III. The inhibitors are mostly pseudo-peptide based with limited ADMET. In our present study, available database InterBioScreen (natural compounds) was screened out for MT-III. Pharmacodynamics and pharmacokinetic studies were performed. Molecular docking and simulations of top hit molecules were performed to study complex stability.

Klíčová slova

Alzheimer's disease, Metallothionein-III, Virtual Screening, ADMET, Molecular Dynamics

Autoři

ROY, S.; KUMAR, A.; PROVAZNÍK, I.

Rok RIV

2014

Vydáno

4. 11. 2014

Nakladatel

IEEE

Místo

Belfast, United Kingdom

ISBN

978-1-4799-5669-2

Kniha

Proceedings IEEE International Conference on Bioinformatics and Biomedicine (BIBM)

Strany od

352

Strany do

356

Strany počet

5

BibTex

@inproceedings{BUT110163,
  author="Sudeep {Roy} and Akhil {Kumar} and Valentine {Provazník}",
  title="Virtual screening, ADMET profiling, molecular docking and dynamics approaches to search for potent selective natural molecule based inhibitors against metallothionein-III to study Alzheimer's disease",
  booktitle="Proceedings IEEE International Conference on Bioinformatics and Biomedicine (BIBM)",
  year="2014",
  pages="352--356",
  publisher="IEEE",
  address="Belfast, United Kingdom",
  isbn="978-1-4799-5669-2"
}