Detail publikačního výsledku

Optical Characterization of Polymeric Thin Films for Photovoltaic Applications by Ellipsometry

SCHMIEDOVÁ, V.; ZMEŠKAL, O.; HEINRICHOVÁ, P.; WEITER, M.

Originální název

Optical Characterization of Polymeric Thin Films for Photovoltaic Applications by Ellipsometry

Anglický název

Optical Characterization of Polymeric Thin Films for Photovoltaic Applications by Ellipsometry

Druh

Abstrakt

Originální abstrakt

This contribution deals with a study on the optical characterization of p-conjugated polymer thin films. There is summary of the thicknesses and the optical properties of researched organic materials such as MDMO-PPV, PCBTDPP, PC60BM, PCDTBT and PC70BM as a potential candidates for optoelectronic applications (OPV, OLED and other).

Anglický abstrakt

This contribution deals with a study on the optical characterization of p-conjugated polymer thin films. There is summary of the thicknesses and the optical properties of researched organic materials such as MDMO-PPV, PCBTDPP, PC60BM, PCDTBT and PC70BM as a potential candidates for optoelectronic applications (OPV, OLED and other).

Klíčová slova

Organic materials, spectroscopy ellipsometry, solar cells, UV-VIS absorption, profilometry

Klíčová slova v angličtině

Organic materials, spectroscopy ellipsometry, solar cells, UV-VIS absorption, profilometry

Autoři

SCHMIEDOVÁ, V.; ZMEŠKAL, O.; HEINRICHOVÁ, P.; WEITER, M.

Vydáno

10.03.2014

Místo

Dresden, Germany

Strany od

132

Strany do

132

Strany počet

1

BibTex

@misc{BUT106284,
  author="Veronika {Schmiedová} and Oldřich {Zmeškal} and Patricie {Heinrichová} and Martin {Weiter}",
  title="Optical Characterization of Polymeric Thin Films for Photovoltaic Applications by Ellipsometry",
  year="2014",
  pages="132--132",
  address="Dresden, Germany",
  note="Abstract"
}