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Detail publikačního výsledku
POSPÍŠILOVÁ, E.; POŘÍZKA, P.; NOVOTNÝ, K.; KAISER, J.; HRADILOVÁ, J.; KANICKÝ, V.
Originální název
Influence of laser wavelength and laser energy on depth profiling of easel painting samples
Anglický název
Druh
Článek WoS
Originální abstrakt
The depth-resolved analysis by means of the laser-induced breakdown spectroscopy (LIBS) is a useful tool in the investigation of multi-layered structures of paintings. The LIBS technique is considered micro-destructive, as it is associated with the formation of the ablation crater. It is important to optimize the laser pulse parameters to minimize the crater size and also to avoid some possible side effects of the laser radiation, such as the material redeposition and the light- or heat-induced pigment discoloration. In the present work, mock-up painting samples were used to investigate the influence of laser radiation characteristics on the ablation process. The first LIBS set-up contains a Nd:YAG laser at the second harmonic frequency (laser wavelength 532 nm, pulse duration similar to 10 ns) and the second set-up is comprised of a modified laser-ablation system equipped with a Nd:YAG laser at the fourth harmonic frequency (laser wavelength 266 nm, pulse duration similar to 5 ns). The influence of different laser wavelengths and different laser energies on the properties of the craters was examined. The effects caused by the laser-ablation process were described.
Anglický abstrakt
Klíčová slova
LIBS; Ablation craters; Fluorine detection
Klíčová slova v angličtině
Autoři
Rok RIV
2020
Vydáno
13.05.2019
Nakladatel
SPRINGER INTERNATIONAL PUBLISHING AG
ISSN
0366-6352
Periodikum
Chemical Papers
Svazek
73
Číslo
12
Stát
Slovenská republika
Strany od
2937
Strany do
2943
Strany počet
7
URL
https://link.springer.com/article/10.1007/s11696-019-00803-z
BibTex
@article{BUT162558, author="Eva {Zikmundová} and Karel {Novotný} and Pavel {Pořízka} and Janka {Hradilová} and Jozef {Kaiser} and Viktor {Kanický}", title="Influence of laser wavelength and laser energy on depth profiling of easel painting samples", journal="Chemical Papers", year="2019", volume="73", number="12", pages="2937--2943", doi="10.1007/s11696-019-00803-z", issn="0366-6352", url="https://link.springer.com/article/10.1007/s11696-019-00803-z" }