Detail publikačního výsledku

Compression Techniques for 4D STEM Data in Electron Microscopy

ŠIMEČEK, V.; MIHÁLIK, O.

Originální název

Compression Techniques for 4D STEM Data in Electron Microscopy

Anglický název

Compression Techniques for 4D STEM Data in Electron Microscopy

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This paper explores compression techniques for 4D scanning transmission electron microscopy (STEM) data, aiming to find an optimal, use-case-independent compression approach. Standard image compression methods, including JPEG, PNG, and JPEG2000, are assessed and compared due to their ability to preserve the structural characteristics of the data. Additionally, a method based on Slepian two-dimensional sequences is proposed. It is conceptually similar to JPEG. The methods are evaluated based on compression ratio and data fidelity to identify an optimal format that maximizes data memory demands while minimizing information loss.

Anglický abstrakt

This paper explores compression techniques for 4D scanning transmission electron microscopy (STEM) data, aiming to find an optimal, use-case-independent compression approach. Standard image compression methods, including JPEG, PNG, and JPEG2000, are assessed and compared due to their ability to preserve the structural characteristics of the data. Additionally, a method based on Slepian two-dimensional sequences is proposed. It is conceptually similar to JPEG. The methods are evaluated based on compression ratio and data fidelity to identify an optimal format that maximizes data memory demands while minimizing information loss.

Klíčová slova

data compression, diffraction, DPSS, electronmicroscopy, image compression, Slepian sequences

Klíčová slova v angličtině

data compression, diffraction, DPSS, electronmicroscopy, image compression, Slepian sequences

Autoři

ŠIMEČEK, V.; MIHÁLIK, O.

Vydáno

29.04.2025

Nakladatel

Brno University of Technology, Faculty of Electrical Engineering and Communication

Místo

Brno, Czechia

ISBN

978-80-214-6321-9

Kniha

Proceedings I of the 31st Conference STUDENT EEICT 2025: General papers

Edice

1

Strany od

91

Strany do

94

Strany počet

4

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2025_sbornik_1.pdf

BibTex

@inproceedings{BUT197779,
  author="Vít {Šimeček} and Ondrej {Mihálik}",
  title="Compression Techniques for 4D STEM Data in Electron Microscopy",
  booktitle="Proceedings I of the 31st Conference STUDENT EEICT 2025: General papers",
  year="2025",
  series="1",
  number="1",
  pages="91--94",
  publisher="Brno University of Technology, Faculty of Electrical Engineering and Communication",
  address="Brno, Czechia",
  isbn="978-80-214-6321-9",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2025_sbornik_1.pdf"
}

Dokumenty

Compression Techniques for 4D STEM Data in Electron Microscopy