Detail aplikovaného výsledku

SEMPA calibration sample with in-plane magnetization

STAŇO, M.; FLAJŠMAN, L.; UHLÍŘ, V.

Originální název

SEMPA calibration sample with in-plane magnetization

Anglický název

SEMPA calibration sample with in-plane magnetization

Druh

Funkční vzorek

Abstrakt

Reference (calibration) sample for Scanning Electron Microscopy with Polarization Analysis (SEMPA/spin-SEM). UHV compatible. Sample contains patterned Fe micro and nanostructures with well-defined magnetic domains. The selected material (Fe, iron) has a high spin-polarization and provides high magnetic signal.

Abstrakt anglicky

Reference (calibration) sample for Scanning Electron Microscopy with Polarization Analysis (SEMPA/spin-SEM). UHV compatible. Sample contains patterned Fe micro and nanostructures with well-defined magnetic domains. The selected material (Fe, iron) has a high spin-polarization and provides high magnetic signal.

Klíčová slova

SEMPA, spin-SEM, magnetic imaging, in-plane magnetization, reference sample, nanotechnology, ion patterning, FIB, magnetic vortex

Klíčová slova anglicky

SEMPA, spin-SEM, magnetic imaging, in-plane magnetization, reference sample, nanotechnology, ion patterning, FIB, magnetic vortex

Umístění

CEITEC BUT, Brno University of Technology Purkyňova 656/123, 61200 Brno, Czech Republic

Licenční poplatek

Výsledek je využíván vlastníkem

www

https://magnetism.ceitec.cz/text/detail/167