Detail publikace

SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis

GUEN, E. KLAPETEK, P. PUTTOCK, R. HAY, B. ALLARD, A. MAXWELL, T. CHAPUIS, P.O. RENAHY, D. DAVEE, G. VALTR, M. MARTINEK, J. KAZAKOVA, O. GOMES, S.

Originální název

SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis

Anglický název

SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis

Jazyk

en

Originální abstrakt

We assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for determining the local phase transition temperature of polymeric materials by means of nano-thermomechanical analysis (nano-TA).

Anglický abstrakt

We assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for determining the local phase transition temperature of polymeric materials by means of nano-thermomechanical analysis (nano-TA).

Dokumenty

BibTex 


@article{BUT170099,
  author="Petr {Klapetek} and Miroslav {Valtr} and Jan {Martinek}",
  title="SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis",
  annote="We assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for determining the local phase transition temperature of polymeric materials by means of nano-thermomechanical analysis (nano-TA).",
  address="Elsevier",
  chapter="170099",
  doi="10.1016/j.ijthermalsci.2020.106502",
  howpublished="online",
  institution="Elsevier",
  number="106502",
  volume="156",
  year="2020",
  month="may",
  pages="1--9",
  publisher="Elsevier",
  type="journal article in Web of Science"
}