Detail publikace

An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference

KROLÁK, D. HORSKÝ, P. PLOJHAR, J.

Originální název

An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

This article proposes an electromagnetic compatibility improved bandgap voltage reference with a low current consumption of only 3.5 uA in an automotive environment with a wide temperature range from -40 degrees C to 160 degrees C and a high electromagnetic interference (EMI) robustness. The proposed reference is based on the well-known Brokaw bandgap with only five bipolar transistors in the bandgap core including collector current leakage compensation. We analyzed parasitic effects in the bandgap core such as the influence of parasitic capacitances between the substrate and the collectors of these bipolar transistors as well as the impact of the operational amplifier. We made recommendations on how to improve the bandgap EMI robustness. Simulation results were compared with measurements on a test chip. The measurement results showed excellent EMI robustness.

Klíčová slova

Bandgap; Electromagnetic interference; Substrates; Bipolar transistors; Capacitors; Capacitance; Integrated circuits; Bandgap reference; Bandgap voltage reference; Brokaw bandgap voltage reference; Electromagnetic compatibility; Electromagnetic interference (EMI); Voltage reference

Autoři

KROLÁK, D.; HORSKÝ, P.; PLOJHAR, J.

Vydáno

3. 1. 2020

Nakladatel

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Místo

Piscataway

ISSN

0018-9375

Periodikum

IEEE Transaction on Electromagnetic Compatibility

Ročník

62

Číslo

5

Stát

Spojené státy americké

Strany od

2277

Strany do

2284

Strany počet

8

URL

BibTex

@article{BUT157458,
  author="David {Krolák} and Pavel {Horský} and Jan {Plojhar}",
  title="An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference",
  journal="IEEE Transaction on Electromagnetic Compatibility",
  year="2020",
  volume="62",
  number="5",
  pages="2277--2284",
  doi="10.1109/TEMC.2019.2958926",
  issn="0018-9375",
  url="https://ieeexplore.ieee.org/document/8949821"
}