Detail publikačního výsledku

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

CHOBOLA, Z., IBRAHIM, A., RŮŽIČKA, Z.

Originální název

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Anglický název

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Anglický abstrakt

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Klíčová slova v angličtině

Light beam induced

Autoři

CHOBOLA, Z., IBRAHIM, A., RŮŽIČKA, Z.

Vydáno

01.01.2001

Nakladatel

University of technology

Místo

Portorož

Kniha

Proceedings of the 6th International Conference of Slovenian Society for Non-destructive Testing

Strany od

335

Strany počet

27

BibTex

@inproceedings{BUT10624,
  author="Zdeněk {Chobola} and Ali {Ibrahim} and Zdeněk {Růžička}",
  title="Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools",
  booktitle="Proceedings of the 6th International Conference of Slovenian Society for Non-destructive Testing",
  year="2001",
  pages="27",
  publisher="University of technology",
  address="Portorož"
}