Detail publikace

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

CHOBOLA, Z., IBRAHIM, A., RŮŽIČKA, Z.

Originální název

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Klíčová slova v angličtině

Light beam induced

Autoři

CHOBOLA, Z., IBRAHIM, A., RŮŽIČKA, Z.

Vydáno

1. 1. 2001

Nakladatel

University of technology

Místo

Portorož

Strany od

335

Strany do

361

Strany počet

27

BibTex

@inproceedings{BUT10624,
  author="Zdeněk {Chobola} and Ali {Ibrahim} and Zdeněk {Růžička}",
  title="Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools",
  booktitle="Proceedings of the 6th International Conference of Slovenian Society for Non-destructive Testing",
  year="2001",
  pages="27",
  publisher="University of technology",
  address="Portorož"
}