Detail publikace

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

CHOBOLA, Z., IBRAHIM, A., RŮŽIČKA, Z.

Originální název

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Anglický název

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Jazyk

en

Originální abstrakt

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Anglický abstrakt

Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools

Dokumenty

BibTex 


@inproceedings{BUT10624,
  author="Zdeněk {Chobola} and Ali {Ibrahim} and Zdeněk {Růžička}",
  title="Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools",
  annote="Light beam induced voltage (LBIV),low frequency nooise and DLTS as silicon solar cell characterization tools",
  address="University of technology",
  booktitle="Proceedings of the 6th International Conference of Slovenian Society for Non-destructive Testing",
  chapter="10624",
  institution="University of technology",
  year="2001",
  month="january",
  pages="335",
  publisher="University of technology",
  type="conference paper"
}