Publication detail

Characterization of thick-film interdigitated electrodes

HUBÁLEK, J., BULVA, J., KREJČÍ, J.

Original Title

Characterization of thick-film interdigitated electrodes

Type

conference paper

Language

English

Original Abstract

A sensor miniaturization brings many problems e.g. an effect of the double layer capacitance, a serial resistance of electrodes, a cell constant, a roughness of electrodes etc. Nowadays, an interdigitated electrodes (IDES) are used in many sensor's applications [3,4,5]. Interdigitated electrodes have a comb structure of electrode system and are deposited on an substrate in planar technology as the thick-film or the thin-film. In most cases good results were achieved using differential or transient measurements. Measurement of frequency characteristics is not possible without a correction of the cell constant. Results of our current research show many problems with the behavioural of chemical cells if the comb structure with small sizes is used. Our results show that conductivity measurements need corrections of the cell constant for each concentration of a liquid solution. This paper investigates how sizes of IDES electrodes influence the interface impedance. Variation of the cell size can show possibilities to find cross relations of all factors and their influence to the cell constant correction.

Key words in English

Interface impedance, Double layer capacitance, cell constant correction

Authors

HUBÁLEK, J., BULVA, J., KREJČÍ, J.

RIV year

2001

Released

13. 9. 2001

Publisher

Ing.Zdeněk Novotný,CSc.

Location

Brno

ISBN

80-214-1960-1

Book

8th Electronic Devices and Systems Conference 2001 and Noise and Non-linearity Testing of modern Electronics Component

Pages from

264

Pages to

268

Pages count

5

BibTex

@inproceedings{BUT4864,
  author="Jaromír {Hubálek} and Jindřich {Bulva} and Jan {Krejčí}",
  title="Characterization of thick-film interdigitated electrodes",
  booktitle="8th Electronic Devices and Systems Conference 2001 and Noise and Non-linearity Testing of modern Electronics Component",
  year="2001",
  pages="5",
  publisher="Ing.Zdeněk Novotný,CSc.",
  address="Brno",
  isbn="80-214-1960-1"
}