Publication detail

Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools

CHOBOLA, Z. IBRAHIM, A. RŮŽIČKA, Z.

Original Title

Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools

Type

conference paper

Language

English

Original Abstract

The technique of Light Beam Induced Voltage LBIV, low frequency noise vs frequency are shown to be a powerful diagnostic technique for determining homogeneity of the doping concentration and Generation Recombination (G.R.) trapping parameters in Si solar cells.

Key words in English

LBIV, noise spectroscopy, DLTS, silicon solar cell

Authors

CHOBOLA, Z.; IBRAHIM, A.; RŮŽIČKA, Z.

Released

13. 9. 2001

Publisher

The Slovenian Society for Non-destructive Testing

Location

Portorož

ISBN

961-90610-1-2

Book

The 6th International Conference of the Slovenian Society for Non-destructive Testing

Pages from

355

Pages to

361

Pages count

7

BibTex

@inproceedings{BUT3494,
  author="Zdeněk {Chobola} and Ali {Ibrahim} and Zbyněk {Růžička}",
  title="Light beam induced voltage (LBIV), low frequency noise and DLTS as silicon solar cell characterization tools",
  booktitle="The 6th International Conference of the Slovenian Society for Non-destructive Testing",
  year="2001",
  pages="7",
  publisher="The Slovenian Society for Non-destructive Testing",
  address="Portorož",
  isbn="961-90610-1-2"
}