Publication detail

Effect of traps and conductive pathways on electron emission from copper broad-area composite emitters

ALSOUD, A.MOUSA, M.S.AL-BASHAISH, S.R.MAGHRABI,M.AL-JBARART, A.A. et al.

Original Title

Effect of traps and conductive pathways on electron emission from copper broad-area composite emitters

Type

journal article in Web of Science

Language

English

Original Abstract

This study investigates electron emission from copper broad-area emitters (CBAEs) and copper broad-area composite emitters (CBACEs) based on the principles of trapping and conductive pathways. Emission current measurements were conducted on two CBACEs, which consisted of copper coated with a 300-400 mu m epoxy resin and subjected to high voltages up to 15 kV. The research specifically examines the 'switch-on' and collapse phenomena occurring within the epoxy layer. Field emission microscopy (FEM) was utilized in a high-vacuum environment ( 10-6 mbar) to observe these effects. A comprehensive model is developed to explain the formation of conductive pathways within the epoxy layer, allowing electrons transfer from traps to the surface. This model treats the composite emitter as a trap-rich capacitor. The study also clarifies the effects of trap density and epoxy layer thickness on the collapse process. To gain a deeper understanding of the model, changes in the I-V curve were examined. Simulations, scanning electron microscopy-energy dispersive x-ray spectroscopy (SEM-EDX) images, and Fourier transform infrared spectroscopy (FTIR) analysis were employed to understand the collapse mechanism of the epoxy collapse. Additionally, Nyquist and Cole-Cole plots were analyzed across frequencies ranging from 1 to 106 Hz before and after applying a high electric field on the samples, revealing changes in the capacitive component and the role of diodes in the formation of conductive channels.

Keywords

composites broad area emitters; field electron emission; epoxy resin; trap; conductive pathways

Authors

ALSOUD, A.;MOUSA, M.S.;AL-BASHAISH, S.R.;MAGHRABI,M.;AL-JBARART, A.A. et al.

Released

1. 11. 2024

Publisher

IOP Publishing Ltd

Location

BRISTOL

ISBN

1402-4896

Periodical

PHYSICA SCRIPTA

Year of study

99

Number

11

State

Kingdom of Sweden

Pages from

1

Pages to

16

Pages count

16

URL

BibTex

@article{BUT196511,
  author="Ammar Awadallah Ahmad {Alsoud} and Kipkurui {Ronoh} and Marek {Sedlařík} and Petr {Sedlák} and Alexandr {Knápek} and Dinara {Sobola}",
  title="Effect of traps and conductive pathways on electron emission from copper broad-area composite emitters",
  journal="PHYSICA SCRIPTA",
  year="2024",
  volume="99",
  number="11",
  pages="1--16",
  doi="10.1088/1402-4896/ad80df",
  issn="1402-4896",
  url="https://iopscience.iop.org/article/10.1088/1402-4896/ad80df/pdf"
}