Publication detail

Thin film deposition and LIDT testing at ISI Brno

OULEHLA, J. LAZAR, J.

Original Title

Thin film deposition and LIDT testing at ISI Brno

Type

conference paper

Language

English

Original Abstract

In this contribution we present a technology for thin film optical coating deposition and laser induced damage threshold (LIDT) testing of coatings available at the Institute of Scientific Instruments. We use our e-beam evaporation coating system equipped with plasma ion assisted deposition to produce various optical coatings and a LIDT test station to test them. The station allows for testing at room temperature as well as cryogenic conditions.

Keywords

thin film optics; e-beam evaporation; coatings; LIDT; laser damage

Authors

OULEHLA, J.; LAZAR, J.

Released

7. 1. 2015

ISBN

9781628415575

ISBN

0277-786X

Periodical

Proceedings of SPIE

State

United States of America

Pages from

94420Y:1

Pages to

94420Y:5

Pages count

4