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OULEHLA, J. LAZAR, J.
Original Title
Thin film deposition and LIDT testing at ISI Brno
Type
conference paper
Language
English
Original Abstract
In this contribution we present a technology for thin film optical coating deposition and laser induced damage threshold (LIDT) testing of coatings available at the Institute of Scientific Instruments. We use our e-beam evaporation coating system equipped with plasma ion assisted deposition to produce various optical coatings and a LIDT test station to test them. The station allows for testing at room temperature as well as cryogenic conditions.
Keywords
thin film optics; e-beam evaporation; coatings; LIDT; laser damage
Authors
OULEHLA, J.; LAZAR, J.
Released
7. 1. 2015
ISBN
9781628415575
0277-786X
Periodical
Proceedings of SPIE
State
United States of America
Pages from
94420Y:1
Pages to
94420Y:5
Pages count
4