Publication detail

Methodics of characterisation for the cold field-emission sources intended for electron microscopy

ŠTRBKOVÁ, L.

Original Title

Methodics of characterisation for the cold field-emission sources intended for electron microscopy

English Title

Methodics of characterisation for the cold field-emission sources intended for electron microscopy

Type

conference paper

Language

en

Original Abstract

The paper deals with the characterization method of the electron emitter for an electron microscope – Fowler-Nordheim analysis. The method is based on the presence of quantum tunnelling, which occurs during the field emission of electrons. The analysis consists of the computation of the essential characteristics of the emitter. These characteristics determine the overall quality of electron emission, as well as provide information about the actual condition of the emitter.

English abstract

The paper deals with the characterization method of the electron emitter for an electron microscope – Fowler-Nordheim analysis. The method is based on the presence of quantum tunnelling, which occurs during the field emission of electrons. The analysis consists of the computation of the essential characteristics of the emitter. These characteristics determine the overall quality of electron emission, as well as provide information about the actual condition of the emitter.

Keywords

field emission, Fowler-Nordheim analysis, finite element method

RIV year

2013

Released

25.04.2013

Publisher

LITERA

Location

Brno

ISBN

978-80-214-4694-6

Book

Proceedings of the 19th Conference STUDENT EEICT 2013 Volume 2

Edition number

1

Pages from

120

Pages to

122

Pages count

3

URL

Documents

BibTex


@inproceedings{BUT114405,
  author="Lenka {Štrbková}",
  title="Methodics of characterisation for the cold field-emission sources intended for electron microscopy",
  annote="The paper deals with the characterization method of the electron emitter for an electron
microscope – Fowler-Nordheim analysis. The method is based on the presence of quantum tunnelling,
which occurs during the field emission of electrons. The analysis consists of the computation
of the essential characteristics of the emitter. These characteristics determine the overall quality of
electron emission, as well as provide information about the actual condition of the emitter.",
  address="LITERA",
  booktitle="Proceedings of the 19th Conference STUDENT EEICT 2013 Volume 2",
  chapter="114405",
  howpublished="print",
  institution="LITERA",
  year="2013",
  month="april",
  pages="120--122",
  publisher="LITERA",
  type="conference paper"
}