Publication detail

Analysis of thin films by TOF LEIS

PRŮŠA, S., KOLÍBAL, M., BÁBOR, P., MACH, J., JURKOVIČ, P., ŠIKOLA, T.

Original Title

Analysis of thin films by TOF LEIS

Type

conference paper

Language

English

Original Abstract

Structural analysis using TOF LEIS.

Key words in English

TOF LEIS, Ga, thin films

Authors

PRŮŠA, S., KOLÍBAL, M., BÁBOR, P., MACH, J., JURKOVIČ, P., ŠIKOLA, T.

RIV year

2003

Released

23. 6. 2003

Publisher

EVC

Location

Berlin

Pages from

133

Pages to

134

Pages count

2

BibTex

@inproceedings{BUT11057,
  author="Stanislav {Průša} and Miroslav {Kolíbal} and Petr {Bábor} and Jindřich {Mach} and Patrik {Jurkovič} and Tomáš {Šikola}",
  title="Analysis of thin films by TOF LEIS",
  booktitle="EVC'03 Abstracts",
  year="2003",
  pages="2",
  publisher="EVC",
  address="Berlin"
}