Publication result detail

Low Noise as a Diagnostic Tool for GaSb based Laser Diodes Prepared by Molecular Beam Epitaxy

LUŇÁK, M.; CHOBOLA, Z.; VANĚK, J.; HULICIUS, E.

Original Title

Low Noise as a Diagnostic Tool for GaSb based Laser Diodes Prepared by Molecular Beam Epitaxy

English Title

Low Noise as a Diagnostic Tool for GaSb based Laser Diodes Prepared by Molecular Beam Epitaxy

Type

WoS Article

Original Abstract

Trasnport and noise characteristics of forward biased semiconductor lasers diodes GaSb based VCSE(Vertical Cavity Surface Emitting) laser were prepared by MBE (Molecular Beam Epitaxy) were measured in order to evaluate the new MBE technology.

English abstract

Trasnport and noise characteristics of forward biased semiconductor lasers diodes GaSb based VCSE(Vertical Cavity Surface Emitting) laser were prepared by MBE (Molecular Beam Epitaxy) were measured in order to evaluate the new MBE technology.

Keywords

noise, spectroscopy, Laser

Key words in English

noise, spectroscopy, Laser

Authors

LUŇÁK, M.; CHOBOLA, Z.; VANĚK, J.; HULICIUS, E.

RIV year

2013

Released

13.05.2012

Publisher

IEEE Serbie

Location

Niš, Serbie

ISBN

2159-1660

Periodical

International Conference on Microelectronics-MIEL

Volume

2012

Number

1

State

United States of America

Pages from

343

Pages to

346

Pages count

4

BibTex

@article{BUT94487,
  author="Miroslav {Luňák} and Zdeněk {Chobola} and Jiří {Vaněk} and Eduard {Hulicius}",
  title="Low Noise as a Diagnostic Tool for GaSb based Laser Diodes Prepared by Molecular Beam Epitaxy",
  journal="International Conference on Microelectronics-MIEL",
  year="2012",
  volume="2012",
  number="1",
  pages="343--346",
  issn="2159-1660"
}