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KOTÁSEK, Z.; RŮŽIČKA, R.; STRNADEL, J.; ZBOŘIL, F.
Original Title
Two Level Testability Analysis System
English Title
Type
Paper in proceedings outside WoS and Scopus
Original Abstract
Principles of two level testability analysis system are described in the paper. The behavioural description of the unit under analysis (UUA) is the first level, on which the source VHDL file is taken as an input. On this level, the VHDL constructions which might cause testability problems in the resulting design are identified and the possibility of deriving i paths is evaluated. The RT level is the second level, on which the testability aspects are taken into account. For these purposes, the RT level structure is converted into a directed labelled graph which reflects the structure of the UUA and its diagnostic features which are important for the testability analysis. The analysis is done on the graph instead of on the VHDL source text.
English abstract
Keywords
RTL, Testability Analysis, VHDL
Key words in English
Authors
Released
01.01.2001
Publisher
Marq software s.r.o.
Location
Ostrava
ISBN
80-85988-57-7
Book
Proceedings of the 35th Spring International Conference MOSIS'01
Pages from
433
Pages to
440
Pages count
8
BibTex
@inproceedings{BUT5604, author="Zdeněk {Kotásek} and Richard {Růžička} and Josef {Strnadel} and František {Zbořil}", title="Two Level Testability Analysis System", booktitle="Proceedings of the 35th Spring International Conference MOSIS'01", year="2001", pages="433--440", publisher="Marq software s.r.o.", address="Ostrava", isbn="80-85988-57-7" }