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JEŘÁBEK, J.; KUBÁNEK, D.; ŠOTNER, R.; DVOŘÁK, J.; ŠEDA, P.; KOTON, J.
Original Title
Study of CMOS-based FOCs Designed with Approximation in Two Frequency Decades
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
This study explores the design of fractional-order capacitors (FOCs) implemented using native n-channel MOS devices in TSMC 65 nm technology. Configurations consisting of four and five interconnected MOS segments are investigated, both considered in two variants, so-called shunted and non-shunted gates. A previously designed genetic algorithm-based program is applied to identify the best structures that approximate constant-phase admittance responses providing input admittance phase within a range of 5 to 85 degrees. The search for suitable solutions is conducted across four distinct frequency bands, enabling a detailed evaluation of the influence of both the topology type and frequency range for each phase value. The results provide insight into the capabilities and limitations of MOS-based Fractional-Order Element (FOE) approximants, offering guidance for their use in analog signal processing applications where fractional-order behavior is desired.
English abstract
Keywords
fractional-order element; MOS transistor; distributed element; frequency bands
Key words in English
Authors
RIV year
2026
Released
03.11.2025
Publisher
IEEE
Location
Firenze, Italy
ISBN
979-8-3315-7675-2
Book
2025 17th International Congress on Ultra Modern Telecommunications and Control Systems and Workshops (ICUMT)
Pages from
101
Pages to
106
Pages count
6
URL
https://ieeexplore.ieee.org/document/11268557
BibTex
@inproceedings{BUT200248, author="{} and Jan {Jeřábek} and {} and David {Kubánek} and {} and Roman {Šotner} and {} and Jan {Dvořák} and {} and Pavel {Šeda} and {} and Jaroslav {Koton}", title="Study of CMOS-based FOCs Designed with Approximation in Two Frequency Decades", booktitle="2025 17th International Congress on Ultra Modern Telecommunications and Control Systems and Workshops (ICUMT)", year="2025", pages="101--106", publisher="IEEE", address="Firenze, Italy", doi="10.1109/icumt67815.2025.11268557", isbn="979-8-3315-7675-2", url="https://ieeexplore.ieee.org/document/11268557" }