Publication result detail

Calibration of scanning thermal microscopes using optimal estimation of function parameters by iterated linearization

CAMPBELL, A.; KLAPETEK, P.; SLESINGER, R.; MARTINEK, J.; HORTVIK, V.; WITKOVSKY, V.; WIMMER, G.

Original Title

Calibration of scanning thermal microscopes using optimal estimation of function parameters by iterated linearization

English Title

Calibration of scanning thermal microscopes using optimal estimation of function parameters by iterated linearization

Type

WoS Article

Original Abstract

Scanning thermal microscopy is a unique tool for the study of thermal properties at the nanoscale. However, calibration of the method is a crucial problem. When analyzing local thermal conductivity, direct calibration is not possible and reference samples are used instead. As the calibration dependence is non-linear and there are only a few calibration points, this represents a metrological challenge that needs complex data processing. In this contribution we present use of the OEFPIL algorithm for robust and single-step evaluation of local thermal conductivities and their uncertainties, simplifying this procedure. Furthermore, we test the suitability of SThM calibration for automated measurement.

English abstract

Scanning thermal microscopy is a unique tool for the study of thermal properties at the nanoscale. However, calibration of the method is a crucial problem. When analyzing local thermal conductivity, direct calibration is not possible and reference samples are used instead. As the calibration dependence is non-linear and there are only a few calibration points, this represents a metrological challenge that needs complex data processing. In this contribution we present use of the OEFPIL algorithm for robust and single-step evaluation of local thermal conductivities and their uncertainties, simplifying this procedure. Furthermore, we test the suitability of SThM calibration for automated measurement.

Keywords

SThM; Calibration; Uncertainty analysis

Key words in English

SThM; Calibration; Uncertainty analysis

Authors

CAMPBELL, A.; KLAPETEK, P.; SLESINGER, R.; MARTINEK, J.; HORTVIK, V.; WITKOVSKY, V.; WIMMER, G.

RIV year

2026

Released

01.12.2025

Periodical

International Journal of Thermal Sciences

Volume

218

Number

12

State

French Republic

Pages from

1

Pages to

8

Pages count

8

URL

https://www.sciencedirect.com/science/article/pii/S129007292500403X

Full text in the Digital Library

http://hdl.handle.net/11012/255860

BibTex

@article{BUT200108,
  author="{} and Petr {Klapetek} and  {} and Jan {Martinek} and  {} and  {} and  {}",
  title="Calibration of scanning thermal microscopes using optimal estimation of function parameters by iterated linearization",
  journal="International Journal of Thermal Sciences",
  year="2025",
  volume="218",
  number="12",
  pages="8",
  doi="10.1016/j.ijthermalsci.2025.110080",
  issn="1290-0729",
  url="https://www.sciencedirect.com/science/article/pii/S129007292500403X"
}