Publication result detail

The Unified Approach to Processor Testing

DRÁBEK, V.

Original Title

The Unified Approach to Processor Testing

English Title

The Unified Approach to Processor Testing

Type

Paper in proceedings outside WoS and Scopus

Original Abstract

The focus is concentrated on different design for testabilityapproaches being used on current processors as full scan, partial scan,standard boundary scan, and so on. An unified approach to processortesting is being proposed, combining several optimised DFT techniques,formal verification and system-level testing.

English abstract

The focus is concentrated on different design for testabilityapproaches being used on current processors as full scan, partial scan,standard boundary scan, and so on. An unified approach to processortesting is being proposed, combining several optimised DFT techniques,formal verification and system-level testing.

Authors

DRÁBEK, V.

Released

01.01.1999

Publisher

unknown

Location

Košice-Herlany

ISBN

80-88922-05-4

Book

CE&I, Sci. Conf., Košice-Herlany, Slovakia

Pages from

192

Pages to

195

Pages count

4

BibTex

@inproceedings{BUT192309,
  author="Vladimír {Drábek}",
  title="The Unified Approach to Processor Testing",
  booktitle="CE&I, Sci. Conf., Košice-Herlany, Slovakia",
  year="1999",
  pages="192--195",
  publisher="unknown",
  address="Košice-Herlany",
  isbn="80-88922-05-4"
}